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[IEEE 1993 IEEE International Symposium on Circuits and Systems - Chicago, IL, USA (3-6 May 1993)] 1993 IEEE International Symposium on Circuits and Systems - SPICE-simulation of nonlinear effects in field-effect-transistors caused by thermal power feedback

✍ Scribed by Schurack, E.; Latzel, T.; Gottwald, A.

Book ID: 126301899
Publisher: IEEE
Year: 1993
Weight: 317 KB
Category: Article
ISBN-13: 9780780312814
DOI: 10.1109/ISCAS.1993.393931

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