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[IEEE 1993 IEEE International Symposium on Circuits and Systems - Chicago, IL, USA (3-6 May 1993)] 1993 IEEE International Symposium on Circuits and Systems - SC circuits: the state of the art compared to SI techniques

✍ Scribed by Temes, G.C.; Deval, P.; Valencic, V.

Book ID: 120934679
Publisher: IEEE
Year: 1993
Weight: 422 KB
Category: Article
ISBN-13: 9780780312814
DOI: 10.1109/ISCAS.1993.393951

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