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[IEEE 1993 IEEE International Symposium on Circuits and Systems - Chicago, IL, USA (3-6 May 1993)] 1993 IEEE International Symposium on Circuits and Systems - Guaranteed linear and nonlinear parameter estimation from bounded-error data: A survey

✍ Scribed by Walter, E.; Piet-Lahanier, H.

Book ID: 111899807
Publisher: IEEE
Year: 1993
Weight: 580 KB
Volume: 0
Category: Article
ISBN-13: 9780780312814
DOI: 10.1109/iscas.1993.393837

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