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[IEEE [1992] Proceedings. Fifth Annual IEEE International ASIC Conference and Exhibit - Rochester, NY, USA (21-25 Sept. 1992)] [1992] Proceedings. Fifth Annual IEEE International ASIC Conference and Exhibit - Testability measure and analysis

✍ Scribed by Reddy, P.V.C.V.

Book ID: 126705181
Publisher: IEEE
Year: 1992
Tongue: English
Weight: 777 KB
Edition: 5
Category: Article
ISBN-13: 9780780307681
DOI: 10.1109/ASIC.1992.270292

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