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[IEEE 1992 International Conference on Industrial Electronics, Control, Instrumentation, and Automation - San Diego, CA, USA (9-13 Nov. 1992)] Proceedings of the 1992 International Conference on Industrial Electronics, Control, Instrumentation, and Automation - On fault diagnosis of analog circuits with tolerance using simulated annealing optimization algorithm

✍ Scribed by Li Yan, ; Weng Xiangying,

Book ID: 118012500
Publisher: IEEE
Year: 1992
Weight: 286 KB
Volume: 0
Category: Article
ISBN-13: 9780780305823
DOI: 10.1109/iecon.1992.254384

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