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[IEEE [1992] Conference Record IEEE Instrumentation and Measurement Technology Conference - Metropolitan, NY, USA (12-14 May 1992)] [1992] Conference Record IEEE Instrumentation and Measurement Technology Conference - Investigations and measurements of the dynamic performance of high speed ADCs

✍ Scribed by Hagelauer, R.; Oehler, F.; Rohmer, G.; Sauerer, J.; Seitzer, D.; Schmitt, R.; Winkler, D.

Book ID: 121750266
Publisher: IEEE
Year: 1992
Tongue: English
Weight: 531 KB
Category: Article
ISBN-13: 9780780306400
DOI: 10.1109/IMTC.1992.245133

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