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[IEEE [1992] Conference Record IEEE Instrumentation and Measurement Technology Conference - Metropolitan, NY, USA (12-14 May 1992)] [1992] Conference Record IEEE Instrumentation and Measurement Technology Conference - Practical considerations in the design of multisine test signals for system identification

✍ Scribed by Rees, D.; Jones, D.L.; Evans, D.C.

Book ID: 111696477
Publisher: IEEE
Year: 1992
Tongue: English
Weight: 573 KB
Volume: 0
Category: Article
ISBN-13: 9780780306400
DOI: 10.1109/imtc.1992.245155

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