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[IEEE [1992] 4th International Conference on Conduction and Breakdown in Solid Dielectrics - Sestri Levante, Italy (22-25 June 1992)] [1992] Proceedings of the 4th International Conference on Conduction and Breakdown in Solid Dielectrics - Detection of degradation in opaque dielectrics by ultrasound

✍ Scribed by Auckland, D.W.; Smith, C.D.; Varlow, B.R.

Book ID: 126743257
Publisher: IEEE
Year: 1992
Weight: 234 KB
Category: Article
ISBN-13: 9780780301290
DOI: 10.1109/ICSD.1992.224928

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