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[IEEE 1991 IEEE MTT-S International Microwave Symposium Digest - Boston, MA, USA (10-14 June 1991)] 1991 IEEE MTT-S International Microwave Symposium Digest - Analysis of shielded coplanar waveguide step discontinuity considering the finite metallization thickness effect

✍ Scribed by Kuo, C.-W.; Kitazawa, T.; Itoh, T.

Book ID: 118141986
Publisher: IEEE
Year: 1991
Weight: 202 KB
Volume: 0
Category: Article
ISBN-13: 9780879425913
DOI: 10.1109/mwsym.1991.147039

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