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[IEEE 1991 IEEE International Solid-State Circuits Conference. Digest of Technical Papers - San Francisco, CA, USA (13-15 Feb. 1991)] 1991 IEEE International Solid-State Circuits Conference. Digest of Technical Papers - 7ns 4Mb BICMOS SRAM With Parallel Testing Circuit

✍ Scribed by Okajima, Y.; Sato, Y.; Kurosaki, K.; Yamada, S.

Book ID: 126735939
Publisher: IEEE
Year: 1991
Weight: 805 KB
Category: Article
ISBN-13: 9780879426446
DOI: 10.1109/ISSCC.1991.689061

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