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[IEEE 1991 Bipolar Circuits and Technology Meeting - Minneapolis, MN, USA (9-10 Sept. 1991)] Proceedings of the 1991 Bipolar Circuits and Technology Meeting - An improved de-embedding technique for on-wafer high-frequency characterization

โœ Scribed by Koolen, M.C.A.M.; Geelen, J.A.M.; Versleijen, M.P.J.G.


Book ID
121840262
Publisher
IEEE
Year
1991
Tongue
English
Weight
346 KB
Category
Article
ISBN-13
9780780301030

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