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[IEEE 1988., IEEE International Symposium on Circuits and Systems - Espoo, Finland (7-9 June 1988)] 1988., IEEE International Symposium on Circuits and Systems - Force-observe, a new design for testability approach (CMOS VLSI circuits)

✍ Scribed by Savaria, Y.; Kaminska, B.

Book ID: 126750709
Publisher: IEEE
Year: 1988
Weight: 259 KB
Category: Article
DOI: 10.1109/ISCAS.1988.14899

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