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[IEEE 1980 IEEE International Solid-State Circuits Conference - San Francisco, CA, USA (1980.02.13-1980.02.15)] 1980 IEEE International Solid-State Circuits Conference. Digest of Technical Papers - Row readout in CID imaging

✍ Scribed by Brown, D.; Burke, H.; Ghezzo, M.; McConnelee, P.; Michon, G.; Vogelsong, T.

Book ID: 126742540
Publisher: IEEE
Year: 1980
Weight: 641 KB
Category: Article
DOI: 10.1109/ISSCC.1980.1156108

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