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[IEEE 1977 IEEE International Solid-State Circuits Conference - Philadelphia, PA, USA (1977.02.16-1977.02.18)] 1977 IEEE International Solid-State Circuits Conference. Digest of Technical Papers - Modeling I2L performance and operational limits

✍ Scribed by Estreich, D.; Dutton, R.

Book ID: 126763777
Publisher: IEEE
Year: 1977
Weight: 341 KB
Category: Article
DOI: 10.1109/ISSCC.1977.1155677

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