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[IEEE 1974 IEEE International Solid-State Circuits Conference - Philadelphia, PA, USA (1974.02.15-1974.02.13)] 1974 IEEE International Solid-State Circuits Conference. Digest of Technical Papers - Automated transistor characterization and parameter generation for linear IC design

✍ Scribed by Ruch, J.; Hin-Chu Poon, ; McCalla, W.; Scharfetter, D.

Book ID: 126687728
Publisher: IEEE
Year: 1974
Weight: 445 KB
Category: Article
DOI: 10.1109/ISSCC.1974.1155263

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