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[IEEE 17th International Symposium on Discharges and Electrical Insulation in Vacuum - Berkeley, CA, USA (21-26 July 1996)] Proceedings of 17th International Symposium on Discharges and Electrical Insulation in Vacuum - Channel spark discharges for thin film technology

✍ Scribed by Witke, T.; Lenk, A.; Siemroth, P.

Book ID: 120291703
Publisher: IEEE
Year: 1996
Weight: 654 KB
Volume: 2
Category: Article
ISBN-13: 9780780329065
DOI: 10.1109/DEIV.1996.545518

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