𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 17th IEEE Instrumentation and Measurement Technology Conference - Baltimore, MD, USA (1-4 May 2000)] Proceedings of the 17th IEEE Instrumentation and Measurement Technology Conference [Cat. No. 00CH37066] - ANN-based error reduction for experimentally modeled sensors

✍ Scribed by Arpaia, P.; Daponte, P.; Grimaldi, D.; Michaeli, L.

Book ID: 126734350
Publisher: IEEE
Year: 2000
Tongue: English
Weight: 605 KB
Edition: 1
Volume: 3
Category: Article
ISBN-13: 9780780358904
DOI: 10.1109/IMTC.2000.848721

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 17th IEEE Instrumentation and Meas

[IEEE 17th IEEE Instrumentation and Measurement Technology Conference - Baltimore, MD, USA (1-4 May 2000)] Proceedings of the 17th IEEE Instrumentation and Measurement Technology Conference [Cat. No. 00CH37066] - Capacitive sensor for relative angle measurement

✍ Cermak, S.; Wandling, F.; Zdiarsky, W.; Fulmek, P.; Brasseur, G. 📂 Article 📅 2000 🏛 IEEE 🌐 English ⚖ 301 KB

[IEEE 17th IEEE Instrumentation and Meas

[IEEE 17th IEEE Instrumentation and Measurement Technology Conference - Baltimore, MD, USA (1-4 May 2000)] Proceedings of the 17th IEEE Instrumentation and Measurement Technology Conference [Cat. No. 00CH37066] - Versatile multipurpose modular instrument for conductivity measurements

✍ DeFuria, J.; Probasco, B.; Mandayam, S.; Schmalzel, J. 📂 Article 📅 2000 🏛 IEEE 🌐 English ⚖ 165 KB

[IEEE 17th IEEE Instrumentation and Meas

[IEEE 17th IEEE Instrumentation and Measurement Technology Conference - Baltimore, MD, USA (1-4 May 2000)] Proceedings of the 17th IEEE Instrumentation and Measurement Technology Conference [Cat. No. 00CH37066] - Fourier based three phase power metering system

✍ Smith, S.C.; Devaney, M.J. 📂 Article 📅 2000 🏛 IEEE 🌐 English ⚖ 575 KB

[IEEE 17th IEEE Instrumentation and Meas

[IEEE 17th IEEE Instrumentation and Measurement Technology Conference - Baltimore, MD, USA (1-4 May 2000)] Proceedings of the 17th IEEE Instrumentation and Measurement Technology Conference [Cat. No. 00CH37066] - High sensitivity inductive sensing system for position measurement

✍ Dong-June Choi, ; Chun-Taek Rim, ; Soohyun Kim, ; Yoon Keun Kwak, 📂 Article 📅 2000 🏛 IEEE 🌐 English ⚖ 480 KB

[IEEE 17th IEEE Instrumentation and Meas

[IEEE 17th IEEE Instrumentation and Measurement Technology Conference - Baltimore, MD, USA (1-4 May 2000)] Proceedings of the 17th IEEE Instrumentation and Measurement Technology Conference [Cat. No. 00CH37066] - A measurement module for automated power supply test equipment

✍ Kennedy, G.; Burton, P. 📂 Article 📅 2000 🏛 IEEE 🌐 English ⚖ 408 KB

[IEEE 17th IEEE Instrumentation and Meas

[IEEE 17th IEEE Instrumentation and Measurement Technology Conference - Baltimore, MD, USA (1-4 May 2000)] Proceedings of the 17th IEEE Instrumentation and Measurement Technology Conference [Cat. No. 00CH37066] - IEEE 1451.2: An interpretation and example implementation

✍ Conway, P.; Heffernan, D.; O'Mara, B.; Burton, P.; Miao, T. 📂 Article 📅 2000 🏛 IEEE 🌐 English ⚖ 575 KB