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[IEEE 16th Annual Applied Power Electronics Conference - APEC 2001 - Anaheim, CA, USA (4-8 March 2001)] APEC 2001. Sixteenth Annual IEEE Applied Power Electronics Conference and Exposition (Cat. No.01CH37181) - Static and dynamic testing of power MOSFETs

✍ Scribed by Galyon, G.T.; Cardinal, J.; Singh, P.J.; Newcomer, J.; Lorenz, W.; Chu, K.

Book ID: 115472357
Publisher: IEEE
Year: 2001
Weight: 956 KB
Volume: 1
Category: Article
ISBN-13: 9780780366183
DOI: 10.1109/apec.2001.911653

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