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[IEEE 14th International Vacuum Microelectronics Conference - Davis, CA, USA (12-16 Aug. 2001)] IVMC 2001. Proceedings of the 14th International Vacuum Microelectronics Conference (Cat. No.01TH8586) - SEM study of physical properties of semiconductor by surface electron beam exciting potential

✍ Scribed by Wenguo Hu, ; Shiqiu Zhu, ; Rau, E.I.

Book ID: 121763184
Publisher: IEEE
Year: 2001
Weight: 114 KB
Category: Article
ISBN-13: 9780780371972
DOI: 10.1109/IVMC.2001.939742

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