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[IEEE 14th IEEE International Symposium on Applications of Ferroelectrics, 2004. ISAF-04. 2004 - Montreal, Canada (23-27 Aug. 2004)] 14th IEEE International Symposium on Applications of Ferroelectrics, 2004. ISAF-04. 2004 - Simulation and measurements of the piezoelectric properties response (d/sub 33/) of piezoelectric layered thin film structures influenced by the top-electrode size

โœ Scribed by Prume, K.; Gerber, P.; Kugeler, C.; Roelofs, A.; Bottger, U.; Waser, R.; Schmitz-Kempen, T.; Tiedke, S.


Book ID
120211853
Publisher
IEEE
Year
2004
Weight
524 KB
Category
Article
ISBN-13
9780780384101

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