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[IEEE 14th Asian Test Symposium (ATS'05) - Calcutta, India (2005.12.21-2005.12.21)] 14th Asian Test Symposium (ATS'05) - Partial Gating Optimization for Power Reduction During Test Application

✍ Scribed by ElShoukry, M.; Tehranipoor, M.; Ravikumar, C.P.

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