[IEEE 14th Asian Test Symposium (ATS'05) - Calcutta, India (2005.12.21-2005.12.21)] 14th Asian Test Symposium (ATS'05) - A New, Flexible and Very Accurate Crosstalk Fault Model to Analyze the Effects of Coupling Noise between the Interconnects on Signal Integrity Losses in Deep Submicron Chips

✍ Scribed by Palit, A.K.; Lei Wu, ; Duganapalli, K.K.; Anheier, W.; Schloeffel, J.

• Book ID: 120568463
• Publisher: IEEE
• Year: 2005
• Weight: 241 KB
• Category: Article
• ISBN-13: 9780769524818
• DOI: 10.1109/ATS.2005.13