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[IEEE 13th International Workshop on Computational Electronics (IWCE) - Beijing, China (2009.05.27-2009.05.29)] 2009 13th International Workshop on Computational Electronics - 3D Finite-Element Analysis of Metal Nanocrystal Memories Variations

✍ Scribed by Shaw, Jonathan T.; Hou, Tuo-Hung; Raza, Hassan; Kan, Edwin C.

Book ID: 126763786
Publisher: IEEE
Year: 2009
Weight: 696 KB
Category: Article
ISBN: 1424439256
DOI: 10.1109/IWCE.2009.5091077

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