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[IEEE 13th International Conference on Semiconducting and Insulating Materials, 2004. SIMC-XIII-2004. - Beijing, People's Republic of China (Sept. 20-25, 2005)] 13th International Conference on Semiconducting and Insulating Materials, 2004. SIMC-XIII-2004. - Deep-defect related generation-recombination noise in GaAs

✍ Scribed by Seghier, D.; Arinbjarnason, T.M.; Gislason, H.P.

Book ID: 121330621
Publisher: IEEE
Year: 2004
Weight: 219 KB
Category: Article
ISBN-13: 9780780386686
DOI: 10.1109/SIM.2005.1511426

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