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[IEEE 12th International Symposium on Power Semiconductor Devices & ICs. Proceedings - Toulouse, France (22-25 May 2000)] 12th International Symposium on Power Semiconductor Devices & ICs. Proceedings (Cat. No.00CH37094) - Dielectric charge traps. A new structure element for power devices

✍ Scribed by Kapels, H.; Plikat, R.; Silber, D.

Book ID: 127167912
Publisher: IEEE
Year: 2000
Weight: 279 KB
Edition: 1
Category: Article
ISBN-13: 9780780362697
DOI: 10.1109/ispsd.2000.856807

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