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[IEEE 12th International Electronic Manufacturing Technology Symposium - Mainz, Germany (April 1-3, 1992)] 12th International Electronic Manufacturing Technology Symposium - Statistical analysis of cycle times in a complex microelectronics manufacturing line

✍ Scribed by Barkany, S.; Fromm, H.; Gihr, O.; Solf, B.

Book ID: 126738419
Publisher: IEEE
Year: 1992
Weight: 286 KB
Category: Article
ISBN-13: 9780780306295
DOI: 10.1109/IEMT.1992.763393

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