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[IEEE 11th IEEE Mediterranean Electrotechnical Conference - Cairo, Egypt (7-9 May 2002)] 11th IEEE Mediterranean Electrotechnical Conference (IEEE Cat. No.02CH37379) - A genetic based algorithm for voltage flicker measurement

✍ Scribed by Al-Hasawi, W.M.; El-Naggar, K.M.

Book ID: 118182456
Publisher: IEEE
Year: 2002
Weight: 389 KB
Volume: 0
Category: Article
ISBN-13: 9780780375277
DOI: 10.1109/melecon.2002.1014663

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