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[IEEE 10th International Conference on Information Technology (ICIT 2007) - Rourkela, Orissa, India (2007.12.17-2007.12.20)] 10th International Conference on Information Technology (ICIT 2007) - Automatic Test Case Generation from UML Models

✍ Scribed by Sarma, Monalisa; Mall, Rajib

Book ID: 126722339
Publisher: IEEE
Year: 2007
Weight: 470 KB
Category: Article
ISBN-13: 9780769530680
DOI: 10.1109/ICIT.2007.26

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