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[IEEE 10th IEEE High Assurance Systems Engineering Symposium (HASE'07) - Plano, TX, USA (2007.11.14-2007.11.16)] 10th IEEE High Assurance Systems Engineering Symposium (HASE'07) - Measuring Reliability as a Mean Failure Cost

✍ Scribed by Mili, Ali; Sheldon, Frederick

Book ID: 120217708
Publisher: IEEE
Year: 2007
Weight: 562 KB
Category: Article
ISBN-13: 9780769530437
DOI: 10.1109/HASE.2007.42

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