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[IEEE 10th Euromicro Conference on Digital System Design Architectures, Methods and Tools (DSD 2007) - Lubeck, Germany (2007.08.29-2007.08.31)] 10th Euromicro Conference on Digital System Design Architectures, Methods and Tools (DSD 2007) - Saboteur-Based Fault Injection for Quantum Circuits Fault Tolerance Assessment

✍ Scribed by Boncalo, Oana; Udrescu, Mihai; Prodan, Lucian; Vladuþiu, Mircea; Amaricai, Alexandru

Book ID: 126671358
Publisher: IEEE
Year: 2007
Weight: 819 KB
Category: Article
ISBN-13: 9780769529783
DOI: 10.1109/DSD.2007.4341534

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