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[IEEE 10th Annual International Symposium on Geoscience and Remote Sensing - College Park, MD, USA (20-24 May 1990)] 10th Annual International Symposium on Geoscience and Remote Sensing - Extraction Of Textural Features In Sar Images: Statistical Model And Sensitivity

✍ Scribed by Rignot, E.; Kwok, R.

Book ID: 120538053
Publisher: IEEE
Year: 1990
Weight: 333 KB
Category: Article
DOI: 10.1109/IGARSS.1990.688914

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