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[IEE Seventh International Conference on Dielectric Materials, Measurements and Applications - Bath, UK (23-26 Sept. 1996)] Seventh International Conference on Dielectric Materials, Measurements and Applications - Measurements of the complex permittivity of microwave circuit board substrates using split dielectric resonator and reentrant cavity techniques

✍ Scribed by Krupka, J.

Book ID: 124095816
Publisher: IEE
Year: 1996
Weight: 343 KB
Volume: 1996
Category: Article
DOI: 10.1049/cp:19960982

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