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[IEE 11th International Symposium on High-Voltage Engineering (ISH 99) - London, UK (23-27 Aug. 1999)] 11th International Symposium on High-Voltage Engineering (ISH 99) - Dielectric breakdown in aluminium nitride

✍ Scribed by Ruemenapp, T.

Book ID: 120079511
Publisher: IEE
Year: 1999
Weight: 407 KB
Volume: 1999
Category: Article
DOI: 10.1049/cp:19990870

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