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Identifying and Correcting Scan Noise and Drift in the Scanning Transmission Electron Microscope

✍ Scribed by Jones, Lewys; Nellist, Peter D.

Book ID
120707632
Publisher
Cambridge University Press
Year
2013
Tongue
English
Weight
978 KB
Volume
19
Category
Article
ISSN
1431-9276

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## Abstract Z‐contrast imaging and electron energy loss spectroscopy in the scanning transmission electron microscope provide the ability to investigate the structure–composition–property relationship at individual defects on the atomic scale. In this article, the main principles behind the techniq