Identification of vacancy-type defects in as-grown InP by positron annihilation rate distribution measurements

✍ Scribed by Z.Q. Chen; X.W. Hu; S.J. Wang; S.Q. Li

• Publisher: Elsevier Science
• Year: 1996
• Tongue: English
• Weight: 543 KB
• Volume: 97
• Category: Article
• ISSN: 0038-1098
• DOI: 10.1016/0038-1098(95)00821-7