✦ LIBER ✦
Identification of Trapping Effects and Ion Neutralization at the Insulator/Semiconductor Interface of MIS Structures from Dynamic Current–Voltage Characteristics of Ion Depolarization
✍ Scribed by E. I. Gol'dman; A. G. Zhdan; N. F. Kukharskaya
- Book ID
- 111567509
- Publisher
- Springer
- Year
- 2000
- Tongue
- English
- Weight
- 59 KB
- Volume
- 29
- Category
- Article
- ISSN
- 1063-7397
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