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Identification of the Si(001) missing dimer defect structure by low bias voltage STM and LDA modelling

✍ Scribed by J.H.G. Owen; D.R. Bowler; C.M. Goringe; K. Miki; G.A.D. Briggs


Book ID
116067548
Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
803 KB
Volume
341
Category
Article
ISSN
0039-6028

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