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Identification of the physical signatures of CDM induced latent defects into a DC–DC converter using low frequency noise measurements

✍ Scribed by Y. Gao; N. Guitard; C. Salamero; M. Bafleur; L. Bary; L. Escotte; P. Gueulle; L. Lescouzeres


Book ID
108210748
Publisher
Elsevier Science
Year
2007
Tongue
English
Weight
712 KB
Volume
47
Category
Article
ISSN
0026-2714

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