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Identification of the oxygen-vacancy defect containing a single hydrogen atom in crystalline silicon

✍ Scribed by Johannesen, P.; Nielsen, B. Bech; Byberg, J. R.

Book ID: 125478516
Publisher: The American Physical Society
Year: 2000
Tongue: English
Weight: 180 KB
Volume: 61
Category: Article
ISSN: 1098-0121
DOI: 10.1103/physrevb.61.4659

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