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Identification of the native defect doping mechanism in amorphous indium zinc oxide thin films studied using ultra high pressure oxidation

✍ Scribed by Lee, Sunghwan; Paine, David C.


Book ID
120415495
Publisher
American Institute of Physics
Year
2013
Tongue
English
Weight
857 KB
Volume
102
Category
Article
ISSN
0003-6951

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