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Identification of native defects around grain boundary in Pr-doped ZnO bicrystal using electron energy loss spectroscopy and first-principles calculations
✍ Scribed by Sato, Yukio; Mizoguchi, Teruyasu; Oba, Fumiyasu; Yodogawa, Masatada; Yamamoto, Takahisa; Ikuhara, Yuichi
- Book ID
- 119993264
- Publisher
- American Institute of Physics
- Year
- 2004
- Tongue
- English
- Weight
- 362 KB
- Volume
- 84
- Category
- Article
- ISSN
- 0003-6951
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