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Identification of nanoindentation-induced phase changes in silicon by in situ electrical characterization

โœ Scribed by Ruffell, S.; Bradby, J. E.; Fujisawa, N.; Williams, J. S.


Book ID
120030725
Publisher
American Institute of Physics
Year
2007
Tongue
English
Weight
366 KB
Volume
101
Category
Article
ISSN
0021-8979

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