𝔖 Bobbio Scriptorium
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Identification of error-capturing scan cells in scan-BIST with applications to system-on-chip

✍ Scribed by Chunsheng Liu; Chakrabarty, K.


Book ID
117907227
Publisher
IEEE
Year
2004
Tongue
English
Weight
927 KB
Volume
23
Category
Article
ISSN
0278-0070

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