✦ LIBER ✦
Identification of Deep Levels Associated with Extended and Point Defects in GeSn Epitaxial Layers Using DLTs
✍ Scribed by Gupta, S.; Simoen, E.; Vrielinck, H.; Merckling, C.; Vincent, B.; Gencarelli, F.; Loo, R.; Heyns, M.
- Book ID
- 121786365
- Publisher
- The Electrochemical Society
- Year
- 2013
- Tongue
- English
- Weight
- 238 KB
- Volume
- 53
- Category
- Article
- ISSN
- 1938-6737
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