Identification and validation of quantitative trait loci conferring tan spot resistance in the bread wheat variety Ernie

✍ Scribed by H. B. Li; W. Yan; G. R. Liu; S. M. Wen; C. J. Liu

• Publisher: Springer
• Year: 2010
• Tongue: English
• Weight: 382 KB
• Volume: 122
• Category: Article
• ISSN: 0040-5752
• DOI: 10.1007/s00122-010-1455-x