IcRn product of YBa2Cu3O7−x ramp-edge junctions at temperatures higher than 30 K
✍ Scribed by Y. Morimoto; Y. Tarutani; H. Wakana; S. Adachi; K. Tsubone; Y. Ishimaru; K. Nakayama; Y. Oshikubo; O. Horibe; N. Iwata; H. Yamamoto; K. Tanabe
- Publisher
- Elsevier Science
- Year
- 2006
- Tongue
- English
- Weight
- 293 KB
- Volume
- 445-448
- Category
- Article
- ISSN
- 0921-4534
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✦ Synopsis
We examined temperature dependence of the I c R n (I c being the critical current and R n being the normal-state resistance) product for interface-engineered YBa 2 Cu 3 O 7Àx ramp-edge junctions formed on a groundplane. There were two types for the temperature dependence of the I c R n product. One was the linear temperature dependence, and the other was a dependence that shows the steeper drop with temperature. There were two factors that were responsible for the temperature dependence of the I c R n value. These were critical temperature T c of the junctions and temperature dependence of the R n value. The I c R n value more than 1 mV at 40 K was obtained for the junction that had the T c of 84 K and the positive coefficient of R n value on temperature.