✦ LIBER ✦
IC manufacturing diagnosis based on statistical analysis techniques : John K. Kibarian and Andrzej J. Strojwas. IEEE Transactions on Components, Hybrids, and Manufacturing Technology15(3), 317 (1992)
- Publisher
- Elsevier Science
- Year
- 1993
- Tongue
- English
- Weight
- 223 KB
- Volume
- 33
- Category
- Article
- ISSN
- 0026-2714
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