Nanostructured TiO 2 thin films were prepared by pulsed laser deposition (PLD) on indium-doped tin oxide (ITO) substrates. Results from X-ray photoelectron spectroscopy (XPS) show that Ti 2p core level peaks shift toward the lower binding energy with decrease in the buffer gas pressure (O 2 :Ar = 1:
โฆ LIBER โฆ
I-VandC-Vproperties of TiO2thin film by pulsed-laser reactive deposition
โ Scribed by Zhengwen Fu; Mingfei Zhou; Shengkun Zhang; Lianyao Chen; Qizong Qin
- Publisher
- Springer
- Year
- 1998
- Tongue
- English
- Weight
- 338 KB
- Volume
- 43
- Category
- Article
- ISSN
- 1001-6538
No coin nor oath required. For personal study only.
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