✦ LIBER ✦
I-5 the relationship between surface and bulk defects in DH LPE GaAs/AlxGa1-xAs wafers
✍ Scribed by Woolhouse, G.R.; Blakeslee, A.E.; Shih, K.K.
- Book ID
- 114591961
- Publisher
- IEEE
- Year
- 1975
- Tongue
- English
- Weight
- 187 KB
- Volume
- 22
- Category
- Article
- ISSN
- 0018-9383
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