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Hydrogen trapping by defects in semiconductors studied by anelastic spectroscopy

✍ Scribed by O. Palumbo; R. Cantelli; F. Cordero

Publisher: Elsevier Science
Year: 2004
Tongue: English
Weight: 113 KB
Volume: 370
Category: Article
ISSN: 0921-5093
DOI: 10.1016/j.msea.2003.08.092

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